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Optical Measurement Systems

Optical measurement systems, end to end

Pick the system that fits your test. ZEISS-certified, US-supported, ready to scale.

Seven system families. One ecosystem

Built to scale from a single coupon test to a full production line

Trilion deploys seven complementary system families covering full-field strain, 3D scanning, photogrammetry, high-speed imaging, automation, and the software that ties them together. Every system ships ZEISS-certified, NIST-traceable, and backed by a US-based engineering team that knows your industry.

Pick a category below to see the products in that family, or jump straight to the dedicated system page for application detail, datasheets, and configuration guidance.

Digital Image Correlation

Full-field strain and displacement, coupon to full-scale

DIC replaces a handful of point sensors with millions of measurement points across the entire specimen surface. The ARAMIS family scales from a single-camera tensile setup to a multi-camera 3D array on a full structural test, all under one software environment.

Learn more about DIC →

Hands-on Metrology

3D scanning that goes where your parts are

From the compact ATOS Q on the inspection bench to the wireless T-SCAN hawk 2 in the field, this family delivers ZEISS-grade structured-light and laser scanning for GD&T inspection, reverse engineering, and digital assembly across automotive, aerospace, and additive manufacturing.

Learn more about Hands-on Metrology →

Photogrammetry, AR & Digital Imaging

Measure large structures and project results back onto parts

TRITOP captures coordinate networks across multi-meter assemblies with a single calibrated camera. SuPAR projects measurement and AI-driven defect overlays directly onto the part in augmented reality. Together they close the loop between large-scale inspection and shop-floor decision-making.

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High-Speed & Thermal Imaging

Capture the events that happen in microseconds

Phantom and Photron high-speed cameras paired with Telops thermal imagers feed ballistic, impact, fluid dynamics, and fracture-mechanics tests at up to 1.75 million frames per second. Trilion engineers integrate the optics, triggering, and lighting so the data lands cleanly in DIC and motion analysis.

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High-Speed & Thermal Imaging products

Phantom, Photron, Telops, and the imaging support stack

Automation & Integration

From manual measurement to scripted production cycles

When the same part comes off the line every 90 seconds, an operator should not be clicking through a measurement wizard. The Trilion Automation Suite, t.Drop, ScanBox cells, and PLC and robot integrations turn optical measurement into a repeatable production step, 60 times faster than laser trackers.

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Automation & Integration products

Production-floor measurement cells and orchestration

Software

The analysis stack behind every Trilion measurement

ZEISS CORRELATE Pro drives full-field DIC. ZEISS INSPECT Pro drives GD&T inspection. The Trilion Automation Suite, t.Setup, and RVAT extend the stack into scripted workflows, browser-based configuration, and real-time virtual assembly tooling. One project model, one export format, one team to call.

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Software products

The Trilion software stack

Accessories

Lighting, mounting, calibration, and the gear that makes a system work

Flicker-free LED lighting, multi-channel controllers, transportable workstations, calibration plates, and the small parts that keep an optical test repeatable. Every accessory in this family is qualified against the systems it pairs with so a Trilion engineer can ship a complete bill of materials, not a kit list.

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Accessories

Lighting, mounts, calibration, and supporting hardware

Browse the catalog

Want to scan the full Trilion product line in one view?

The product catalog lets you filter every system by family, application, and industry. Useful when you already know the spec you need.

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Not sure where to start?

Tell a Trilion engineer what you are testing. We will map your application to the right system, or tell you honestly when none of ours fits.

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