Skip to content

Hands-on Metrology

ZEISS METROTOM

Industrial CT scanner for non-destructive metrology

ZEISS METROTOM is the industrial computed-tomography platform in the ZEISS Quality Suite ecosystem. Captures full internal and external geometry from a single scan, ideal for porosity analysis, internal defect detection, dimensional inspection of additively-manufactured parts, and reverse engineering of assemblies that optical or tactile tools cannot reach.

Request a Demo

Specifications

Key Technical Data

  • Industrial X-ray CT with sub-micron voxel resolution
  • Voxel point clouds in vgi, vgl, pcr, exv, rek formats
  • Automatic scan rotations and easy part positioning
  • Full surface mesh extraction from X-ray data
  • NIST-traceable calibration and repeatability
  • Integrates with ZEISS INSPECT for downstream evaluation

Industries & Applications

Additive Manufacturing Material Testing 3D Scanning

Ready to see ZEISS METROTOM in action?

Talk to an engineer about how this system fits your testing program.

Request a Demo Talk to an Engineer