Electronics & Semiconductors
See thermal and vibration response, point by point
Full-field strain on populated boards, components, and packages, where strain gages cannot reach every solder joint
The Problem
Strain gauges are too large for solder balls and die surfaces. Failures that start at microns stay invisible until warranty claims roll in.
The Solution
Three ways Trilion de-risks electronics
Solder Joint Reliability
High-mag DIC captures strain across full BGA arrays to predict which joints fail first.
PCB Warpage
Map out-of-plane deformation through reflow to catch head-in-pillow and co-planarity defects.
Drop & Shock
High-speed DIC resolves bending modes and strain waves during millisecond failure events.
Applications
Integrated thermo-mechanical
“Synchronized IR + DIC correlates temperature gradients with strain localization on the same surface.”
Built for semiconductor and consumer electronics labs
Ready to find failures earlier?
Talk to an engineer about solder reliability, warpage, or drop testing.
Featured Resources
Case studies, white papers, and application notes
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Key Products & Systems
Purpose-built systems for your application
The full 3D DIC portfolio
ARAMIS Optical Strain
ARAMIS family covers portable on-machine testing through fixed-base certification and motion analysis.
Learn more →6-DOF drop test automation
t.Drop
Automate drop-test campaigns from fixture setup through 6-DOF motion analysis and reporting. Built for consumer electronics, packaging, and medical device drop programs.
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Physical Simulation Systems for Materials Research and Manufacturing
Gleeble Thermo-Mechanical Simulation System
Gleeble's line of thermo-mechanical simulators purpose-built to address the most demanding challenges in materials testing. Whether you're developing next-generation alloys, optimizing manufacturing processes, or validating material performance under extreme conditions, Gleeble's physical simulation systems deliver the precision, repeatability, and control that materials scientists and engineers demand.
Learn more →From the Blog
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High-Speed DIC for Impact and Crash Testing
In impact, crash, and drop testing, failure can happen in milliseconds. A component may deform, buckle, crack, or abs...
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Why “Legacy Knowledge” Is Undermining Your ARAMIS Data
Why “Legacy Knowledge” Is Undermining Your ARAMIS Data
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