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Electronics & Semiconductors

See thermal and vibration response, point by point

Full-field strain on populated boards, components, and packages, where strain gages cannot reach every solder joint

The Problem

Strain gauges are too large for solder balls and die surfaces. Failures that start at microns stay invisible until warranty claims roll in.

The Solution

Three ways Trilion de-risks electronics

Solder Joint Reliability

High-mag DIC captures strain across full BGA arrays to predict which joints fail first.

PCB Warpage

Map out-of-plane deformation through reflow to catch head-in-pillow and co-planarity defects.

Drop & Shock

High-speed DIC resolves bending modes and strain waves during millisecond failure events.

Micron
Resolution
1000s fps
Drop & shock
DIC + IR
Thermo-mechanical
BGA
Full array capture

Applications

ARAMIS DIC strain map overlaid on an integrated circuit showing thermal deformation across the chip surface.
Full-field strain on an integrated circuit, used to validate thermomechanical behavior in electronics packages.
Close-up of a speckle patterned electronics component instrumented for ARAMIS SRX measurement.
A speckle pattern on the heat sink lets ARAMIS SRX track sub-pixel deformation across the part during a vibration or thermal cycle.

Integrated thermo-mechanical

“Synchronized IR + DIC correlates temperature gradients with strain localization on the same surface.”

Built for semiconductor and consumer electronics labs

Ready to find failures earlier?

Talk to an engineer about solder reliability, warpage, or drop testing.